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    Oakland University
   
 
  Nov 24, 2017
 
 
    
2017-2018 Undergraduate Catalog
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ECE 4510 - Machine Vision

(4)
Introduction to machine vision; image formation (impacts of lighting and optics); image processing; feature detection and matching; feature-based alignment. Industrial applications for machine vision; gauging; inspection; guidance; identification. Laboratory based projects. (Formerly ECE 439)
Prerequisite(s): (ECE 335 or ECE 3204)



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